IEEE CASE 2017 先知科技顧問鄭芳田教授演講照片集錦
演講主題： Applying AVM & AMCoT for Industry 4.1
Virtual Metrology (VM) is a method to conjecture manufacturing quality of a process tool based on data sensed from the process tool and without physical metrology operations. In other words, VM can convert sampling inspection with metrology delay into real-time and on-line total inspection. This talk will first introduce the theories and functions of the Automatic Virtual Metrology (AVM) system and then demonstrate how to apply AVM to high-tech (semiconductor, TFT-LCD, etc.) and traditional machine-tool (automobile wheel machining, airplane engine casing, etc.) industries.
The current Industry 4.0 platform can only keep the faith of achieving the nearly Zero-Defects state without realizing this goal. In other words, Industry 4.0 only emphasizes "Enhancing Productivity" but not "Improving Quality". The key reason for this inability is the lack of an affordable online and real-time total inspection system. The Zero-Defects state can be achieved by adopting the AVM system due to its capability of providing all products total inspection data. As the AVM system is integrated with the Industry 4.0 platform, the goal of Zero-Defects can be accomplished, which is defined as "Industry 4.1".
This talk then focuses on how to utilize Internet of Things (IoT), Big Data Analysis, Cloud Manufacturing (CM), and Cyber Physical Systems (CPS) along with the AVM technology to develop an Advanced Manufacturing Cloud of Things (AMCoT) that construct a smart manufacturing platform for achieving the goals of Industry 4.1.