The joint patent application of NCKU and FS-TECH entitled “Metrology Samling Method and Computer Program Product Thereof” has been certificated.
Congratulations! The joint patent application of NCKU and FS-TECH entitled “Metrology Samling Method and Computer Program Product Thereof” (Inventors: Fan-Tien Cheng, Chun-Fang Chen, Hsuan-Heng Huang and Chu-Chieh Wu) has been certificated the U.S.A ISD Patent no. US009829415B2.